Improved extended depth-of-field microscopy through PSF engineering and robust processing
Abstract
Performance investigation of improved extended depth-of-field microscopy achieved with point-spread function engineering to reduce image artifacts due to depth-induced aberrations nd processing that is robust to system noise. © 2012 Optical Society of America.
Publication Title
Computational Optical Sensing and Imaging, COSI 2012
Recommended Citation
Yuan, S., & Preza, C. (2012). Improved extended depth-of-field microscopy through PSF engineering and robust processing. Computational Optical Sensing and Imaging, COSI 2012 https://doi.org/10.1364/cosi.2012.cm2b.3
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