PSF engineering to reduce the impact of depth-induced aberrations on wide-field microscopy imaging

Authors

Shuai Yuan, University of MemphisFollow
Chrysanthe Preza, University of Memphis

Abstract

We evaluated different phase mask designs for PSF engineering using wavefront encoding, to reduce the impact of depth-induced aberrations, due to refractive index mismatch, on 3D computational wide-field microscopy. © 2011 Optical Society of America.

Publication Title

Optics InfoBase Conference Papers

Recommended Citation

Yuan, S., & Preza, C. (2011). PSF engineering to reduce the impact of depth-induced aberrations on wide-field microscopy imaging. Optics InfoBase Conference Papers https://doi.org/10.1364/cosi.2011.ctua3