Tunable-frequency three-dimensional structured illumination microscopy with reduced data-acquisition
Abstract
The performance of a tunable three-dimensional (3D) structured illumination microscope (SIM) system and its ability to provide simultaneously super-resolution (SR) and optical-sectioning (OS) capabilities are investigated. Numerical results show that the performance of our 3D-SIM system is comparable with the one provided by a three-wave interference SIM, while requiring 40% fewer images for the reconstruction and providing frequency tunability in a cost-effective implementation. The performance of the system has been validated experimentally with images from test samples, which were also imaged with a commercial SIM based on incoherent-grid projection for comparison. Restored images from data acquired from an axially-thin fluorescent layer show a 1.6× improvement in OS capability compared to the commercial instrument while results from a fluorescent tilted USAF target show the OS and SR capabilities achieved by our system.
Publication Title
Optics Express
Recommended Citation
Doblas, A., Shabani, H., Saavedra, G., & Preza, C. (2018). Tunable-frequency three-dimensional structured illumination microscopy with reduced data-acquisition. Optics Express (23), 30476-30491. https://doi.org/10.1364/OE.26.030476
