A method to quantify the dependence of spur heights on offset current in a CP-PLL

Authors

Michael Peter Kennedy, University College CorkFollow
Hongjia Mo, University College Cork
Zhen Huang, University College Cork
Joao Paulo Lana, Universidade Federal de Minas Gerais

Abstract

This paper presents a computationally efficient method to determine how the pattern of spurs in a fractional-N frequency synthesizer depends on the local nonlinearity of the phase-frequency detector and charge pump (PFD-CP). It also presents a case study using a transistor-level model of a common PFD-CP architecture.

Publication Title

Proceedings - IEEE International Symposium on Circuits and Systems

Recommended Citation

Kennedy, M., Mo, H., Huang, Z., & Lana, J. (2016). A method to quantify the dependence of spur heights on offset current in a CP-PLL. Proceedings - IEEE International Symposium on Circuits and Systems, 2016-July, 1658-1661. https://doi.org/10.1109/ISCAS.2016.7538885