A rigorous exposition of the LEMMA method for analog and mixed-signal testing
Abstract
The linear error-mechanism modeling technique is an effective tool for testing analog and mixed-signal devices which minimizes the number of measurements required to characterize the static transfer function of a circuit by determining a small number of parameters of a linear error model and then predicting the entire response error. This work focuses on optimizing the linear error-mechanism model algorithm (LEMMA), introducing novel refinements which are shown to improve its performance significantly. We outline the implementation of the algorithm in a tutorial manner, paying due consideration to the underlying theory where required. © 1999 IEEE.
Publication Title
IEEE Transactions on Instrumentation and Measurement
Recommended Citation
Wrixon, A., & Kennedy, M. (1999). A rigorous exposition of the LEMMA method for analog and mixed-signal testing. IEEE Transactions on Instrumentation and Measurement, 48 (5), 978-985. https://doi.org/10.1109/19.799657
