Extending the servo-loop for ADC transition level measurements under dynamic input conditions
Abstract
For high-resolution Nyquist-rate ADCs, testing the linearity of the transfer characteristic at all-codes becomes very time consuming as the number of codes increases exponentially with resolution. In [1], a model-based test approach has been proposed based on measurements using a Servo-loop [2]. With the servo-loop, the ADC linearity is tested under static input conditions by measuring only a small subset of code transition levels. Adopting this short-codes approach, we propose a faster settling servo-loop implementation. We extend the servo-loop and the model-based short-codes test to linearity testing under dynamic input conditions [3].
Publication Title
Conference Record - IEEE Instrumentation and Measurement Technology Conference
Recommended Citation
Wegener, C., & Kennedy, M. (2001). Extending the servo-loop for ADC transition level measurements under dynamic input conditions. Conference Record - IEEE Instrumentation and Measurement Technology Conference, 3, 2031-2036. Retrieved from https://digitalcommons.memphis.edu/facpubs/17444