LEMMA developer's toolbox: Semi-automated test development for analog and mixed-signal circuits

Abstract

Analog test represents an increasing fraction of the cost of producing analog and mixed-signal integrated circuits. While digital testing can focus on identifying spot defects in a systematic manner, analog functional testing requires very precise and accurate measurements. Pessimistic forecasts suggest that `in the next few years the total product cost of a mixed-signal device will be almost entirely due to the cost of the analog tests'. The LEMMA method is a model-based approach to minimizing the analog test effort by identifying a robust minimum set of testpoints.

Publication Title

Proceedings - IEEE International Symposium on Circuits and Systems

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