LEMMA-ADC: the linear error mechanism modelling algorithm applied to A/D-converters

Abstract

In this study, an attempt is made to demonstrate that the LEMMA model development approach can be extended beyond Digital-to-Analog Converters (DACs). For the chosen Analog-to-Digital Converter (ADC), it is demonstrated that the LEMMA method can cut the test time for the (all codes testing) histogram method by reducing the required number of hits per code by a factor of two, without reducing the accuracy of the INL-result. LEMMA's potential to save test time by using a short-codes test is also illustrated.

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IEE Conference Publication

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