Model-based testing of high-resolution ADCS
Abstract
Testing Analog-to-Digital Converters (ADCs) involves time-consuming measurements to estimate the location and spacing between the transition levels. From these measurements the Integral and Differential Nonlinearity (INL and DNL) are determined and cross-checked against the values given on the data sheet. The Histogram test, an all-codes test, is widely used in industry. In this work, we compare for high-resolution ADCs this test method with a short-codes method that is based on combining the Servo-loop setup and the LEMMA modeling technique. We demonstrate how and why the latter method outperforms histogramming in terms of test time.
Publication Title
Proceedings - IEEE International Symposium on Circuits and Systems
Recommended Citation
Wegener, C., & Kennedy, M. (2000). Model-based testing of high-resolution ADCS. Proceedings - IEEE International Symposium on Circuits and Systems, 1 https://doi.org/10.1109/ISCAS.2000.857098
