Overcoming test setup limitations by applying model-based testing to high-precision ADCs
Abstract
Test setup limitations, such as noise and parasitics, increasingly impede repeatable and accurate linearity measurements in high-volume production testing of high-precision data converters. Model-based testing has been shown to reduce the adverse effects of noise [14]. In this work, we present two enhancements of the linear model-based approach: one is a change of the modeling strategy in order to account for measurement errors induced, for example, by parasitics associated with the device contactor, and another is a Design-for-Test feature that significantly improves the model's ability to reduce the effect of measurement noise on the accuracy of the test outcome. © 2005 Springer Science + Business Media, Inc.
Publication Title
Journal of Electronic Testing: Theory and Applications (JETTA)
Recommended Citation
Wegener, C., & Kennedy, M. (2005). Overcoming test setup limitations by applying model-based testing to high-precision ADCs. Journal of Electronic Testing: Theory and Applications (JETTA), 21 (3), 299-310. https://doi.org/10.1007/s10836-005-6359-3
