Testing ADCs for static and dynamic nonlinearities -killing two birds with one stone
Abstract
Traditionally, static linearity and dynamic distortion tests are performed separately for ADCs. To this end, a low-frequency sinewave is histogrammed to measure static Integral Nonlinearity, and a high-frequency sine-wave is sampled for FFT processing to measure dynamic distortions and dynamic range. We propose to use a model-based technique to extract both static and dynamic nonlinearities from a single data record of a sampled high-frequency sine-wave. This saves test time as the ADC converts fewer samples.
Publication Title
4th IMEKO TC4 Conference on Advanced A/D and D/A Conversion Techniques and Their Applications and the 7th Workshop on ADC Modelling and Testing 2002
Recommended Citation
Wegener, C., & Kennedy, M. (2002). Testing ADCs for static and dynamic nonlinearities -killing two birds with one stone. 4th IMEKO TC4 Conference on Advanced A/D and D/A Conversion Techniques and Their Applications and the 7th Workshop on ADC Modelling and Testing 2002 Retrieved from https://digitalcommons.memphis.edu/facpubs/17686
