Linear model-based testing of ADC nonlinearities
Abstract
In this brief, we demonstrate the procedures of linear model-based testing for the example of a 12-b Nyquist-rate analog-to-digital converter (ADC). In a production test environment, we apply this technique to two wafer lots of devices, and we establish that the model is robust with respect to its ability to reduce the uncertainty of the test outcome. Reducing this uncertainty is particularly beneficial for higher resolution devices, for which measurement noise increasingly corrupts the measured "signal" that is the nonlinearity of the device under test. © 2004 IEEE.
Publication Title
IEEE Transactions on Circuits and Systems I: Regular Papers
Recommended Citation
Wegener, C., & Kennedy, M. (2004). Linear model-based testing of ADC nonlinearities. IEEE Transactions on Circuits and Systems I: Regular Papers, 51 (1), 213-217. https://doi.org/10.1109/TCSI.2003.821281
