Testing ADCs for static and dynamic INL - Killing two birds with one stone
Abstract
Traditionally, static linearity and dynamic distortion tests are performed separately for ADCs. A low-frequency sine wave is histogrammed to measure static Integral Nonlinearity (INL), and a high-frequency sine wave is sampled for FFT processing to measure dynamic distortions and dynamic range. This work describes a model-based technique to extract both static and dynamic nonlinearities from a single data record of a sampled high-frequency sine wave. This saves test time as the ADC converts fewer samples. © 2003 Elsevier Science B.V. All rights reserved.
Publication Title
Computer Standards and Interfaces
Recommended Citation
Wegener, C., & Kennedy, M. (2004). Testing ADCs for static and dynamic INL - Killing two birds with one stone. Computer Standards and Interfaces, 26 (1), 15-20. https://doi.org/10.1016/S0920-5489(03)00058-8
